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MIL-STD-883E, Test Method Standard for Microcircuits

MIL-STD-883E, Test Method Standard for Microcircuits

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3016 Activation time verification ... 3020 High impedance (off-state) low-level output leakage current 3021 High impedance (off-state) high-level output leakage current 3022 Input clamp voltage ... 4005.1Output performance 4006.1Power gain and noise figure 4007 Automatic gain control range. MIL-STD-883E vi TEST METHODS

  Performance, Verification, Noise

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