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MEMS Solution for Semiconductor Probing - SWTest.org
www.swtest.orgMEMS Solution for Semiconductor Probing South-Western Testing Workshop Presentation 矽晶源高科股份有限公司 SCS Hightech Inc. Presented by Dr. Howard Hsu
Southwest Test Conference - SWTest.org
www.swtest.orgWe must determine the uncertainty of our measurement systems before we can compare, control or optimize our manufacturing processes. Cerprobe’s Philosophy
Introduction to Wafer Level Burn-In - SWTest.org
www.swtest.orgConventional Burn In • Used for years to reduce “infant mortalities” • Mil STD 38510 & Mil STD 883E, Method 1015.9 • Typically 125% Vcc, 125O C, 48 to 168 hours • Either DC bias or full dynamic operation • Voltage and temperature life acceleration follow the Arrhenius model: – Temperature and voltage independently and exponentially accelerate failure modes