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1 4441 444 Nov. 2006 679 5198 1 1 1E-mail m-suzuki 679 5198 1 1 1E-mail hirono S/N

2 X X X 1 3 SPring-8 XAFS 1)

3 XAFS (C) 2006 The Japanese Society for Synchrotron Radiation Research(C) 2006 The Japanese Society for Synchrotron Radiation Research4452 445 Nov.

4 2006 X-ray Magnetic CircularDichroism: XMCD 2) Fe Ni XMCD XMCD XAFS X XMCD 1 X 2.

5 Fig. 1(a),(b),(c Fig. 1(d),(e X x y t xy x y {Ex Ex0cosvtEy Ey0cos(vt d)(1) v 2pc/l l c d Ex0 Ey0 (1) x y v Ex0 Ey0 d (1) Ex Ey (1) d 0 p d 0 Ex0 E0cosq Ey0 E0sinq {Ex E0cosqcosvtEy E0sinqcosvt(2) Fig.))}}

6 1(c) q Fig. 1(c) q 45 q 0 90 Fig. 1(a),(b) (1) d p/2 |Ex0| |Ey0| (2) {Ex E0/2cosvtEy E0/2sinvt(3) d p/2 d p/2 2 d p/2 Fig. 1(d) d p/2 Fig. 1(e) q d 446 Fig.}

7 1 Various polarization 1(c) 45 0 Fig. 1(a),(b),(c) 1 S1 PL 3) 4S1 PC 1 1 PC 95 446 Nov. 2006 Ipol Inon V V IpolIpol Inon(4) V Ix Iy S1 S1 Ix IyIx Iy Inon(5) Ix Iy Ipol Fig.

8 1(a) S1 1 Fig. 1(b) S1 1 3 PC PC IR ILIR IL Inon(6) IR(IL) PC 1 PC 1 4 XAFS MCD S1 PC MCD PC MCD PC 1 447 Fig. 2 The rotating analyzer method. Intensity of light transmittedthrough a linear polarizer is monitored as a function ofazimuth of Nov. 2006 S1 PC 4 5 Fig.

9 1(a ),(b ),(c p/2 Fig. 1(d ),(e p/2 p/2 l/4 d 0 Ex0 Ey0 E0/2 (1) q 45 (2) l/4 d p/2 (3) l/4 45 d 0 Ex0 Ey0 E0/2 q 45 l/4 p l/2 (1) d 0 Ex0 Ey0 E0/2 45 d p 90 q 45 45 3 PL q PC PL q X X n tanu 1/n u X s p 1 45))

10 45 0 Fig. 2 PL q S1 PLcos(2q) PL q l/4 l/4 l/4 l/4 l/4 l/4 448 Fig.