Keysight Technologies Performing LTE and LTE-Advanced RF ...

1 Keysight Technologies Performing LTE and LTE-AdvancedRF Measurements with the E7515A UXM Wireless Test Set Based on 3 GPP TS Application Note 02 | Keysight | Performing LTE and LTE-Advanced Measurements Application NoteContents1 Introduction2 LTE/ LTE-Advanced RF Measurements with the UXM3 Common Test Environmental Channel Bandwidths and Test Physical Connections4 Transmitter Common Parameters for Transmitter Saving Common Additional Test Conditions for Transmitter Example Test Procedure for UE Maximum Output Power (sc ) Example Test Procedure for Maximum Power Reduction (MPR) (sc ) Example Test Procedure for Additional Maximum Power Reduction (A-MPR) (sc ) Example Test Procedure for Configured UE Transmitted Power Output (sc ) Example Test Procedure for Minimum Output Power (sc ) Example Test Procedure for Transmit OFF Power (sc ) Example Test Procedure for General ON/OFF Time Mask (sc ) Example Test Procedure for PRACH Time Mask (sc ) Example Test Procedure for SRS Time Mask (sc ) Example Test Procedure for Power Control Absolute Power Tolerance (sc ) Example Test Procedure for Aggregate Power Control Tolerance (sc ) Example Test Procedure for Frequency Error (sc ) Example Test Procedure for Error Vector Magnitude (sc ) Example Test Procedure for PUSCH-EVM with Exclusion Period (sc ) Example Test Procedure for Carrier Leakage (sc ) Example Test Procedure for In-Band Emissions for Non-Allocated RB (sc ) Example Test Procedure for EVM Equalizer Spectrum Flatness (sc ) Example Test Procedure for Occupied Bandwidth (sc )

2 Example Test Procedure for Spectrum Emission Mask (sc ) Example Test Procedure for Additional Spectrum Emission Mask (sc ) Example Test Procedure for Adjacent Channel Leakage Power Ratio (sc )5 Receiver Characteristics without Carrier Overview of Receiver Characteristics without Common Parameters for Receiver Characteristics without Additional Test Conditions for Receiver Characteristics without Example Test Procedure for Reference Sensitivity Level (c ) Example Test Procedure for Maximum Input Level (c ) Example Test Procedure for Adjacent Channel Selectivity (c ) Example Test Procedure for In-Band Blocking (sc )468889111111131417202325282830333537414 65256596468707376828282838487909503 | Keysight | Performing LTE and LTE-Advanced Measurements Application Note6 Receiver Characteristics with Carrier Overview of Receiver Characteristics with DL Common Parameters for Receiver Characteristics with DL Additional Test Conditions for Receiver Characteristics with Example Test Procedure.

3 For Ref. Sens. Level for Interband DL CA w/o UL CA (sc ) Example Test Procecure for Max. Input Level for Interband DL CA w/o UL CA (sc )7 References8 Test Channels for Transmitter and Receiver 3 GPP Measurement Modulation and RB Allocation for Transmitter Characteristics without Modulation and RB Allocation for Receiver Characteristics without Troubleshooting RF Measurements1001001001011011061111121121 1611912512704 | Keysight | Performing LTE and LTE-Advanced Measurements Application Note1 IntroductionThe third-generation partnership project (3 GPP) defines standards for development and test of 3G and 4G system components. The technical specification (TS) defines requirements for radio frequency (RF) testing of long-term evolution (LTE) and LTE-Advanced (LTE-A) user equipment (UE). This application note provides example test proce-dures for RF testing of LTE and LTE-A UEs based on 3 GPP TS (2014-06).

4 Many references are made to 3 GPP TS in this application note. In most cases, these references are abbreviated as References to other 3 GPP documents are abbreviated in a similar requires all tests to be performed over all E-UTRA bands supported by the UE. In some cases, there are band-specific setups and requirements. This application note provides example test procedures for frequency division duplex (FDD) E-UTRA Band 3. Additional bands can be tested following a similar set of steps. E-UTRA bands are defined in clause also requires all tests to be performed over the lowest and highest channel band-widths supported in each band. In addition, all tests must be performed with a channel bandwidth of 5 MHz. There are bandwidth-specific setups and requirements as well. This application note provides example test procedures for a channel bandwidth of 20 MHz. Additional bandwidths can be tested following a similar set of steps.

5 Channel bandwidths for each E-UTRA band are defined in clause this application note from Keysight Technologies , Inc. example procedures use the E7515A UXM wireless test set with E7630A LTE/LTE-A lab application (LA) software. The software version is , released on 30 September 2014. Unless otherwise indicated, E7530A LTE/LTE-A test application (TA) software can also be used with the example proce-dures. Visit the Keysight UXM web page for detailed product information and access to software downloads at defines specific requirements for RF testing, but RF design verification often requires additional test configurations. Although this application note describes example procedures based on 3 GPP tests, the UXM also supports testing using non-standards-based configurations with flexible RB allocation and modulation setup, many graphical measure-ment results and powerful measurement UXM provides the tools needed to be confident about a device s RF performance.

6 These include flexible receiver test, trusted X-Series transmitter measurement science, and network emulation. This enables configuration of defined conditions with varying frequen-cies, power, and modulation, measurement to limits, and determination of the root-cause of failures with reliable, repeatable results that can be automated and easily shared. Test from early designs to finished products since the UXM supports both signaling and non-signaling test, making it easy to just connect. Keysight also provides fully automated and independently validated conformance solu-tions that provide assured compliance to the latest version of 3 GPP test specifications. Visit for more | Keysight | Performing LTE and LTE-Advanced Measurements Application NoteThroughout this application note, selections and entries on the UXM front panel are shown as > ConfigThis represents clicking on or touching the Cell lower tab, and then clicking on or touching the Config upper tab to enable access to the desired parameter setting or , the words can represent actions using menu keys or active areas of the UXM front panel.

7 Here is one > Back > Handover > Blind HandoverThis represents clicking on or touching the Back, Handover, and Blind Handover menu test system configuration may include significant losses due to cabling and use of splitters or couplers external to the UXM. Compensation for external cable losses are configured on the UXM Control Panel. Refer to the UXM User s and Programmer s Guide for a description of how to specify cable loss. (See Section 7 of this application note.) The LTE/LTE-A application controls whether cable loss compensation is enabled using the System > Config > Cable Loss Compensation setting. Note that this setting is non-volatile and is not affected by a | Keysight | Performing LTE and LTE-Advanced Measurements Application Note2 LTE/LTE-A RF Measurements with the UXM The following tables describe the UXM s support for measurements in the transmitter and receiver characteristics sections of In addition, the Wireless Test Manager (WTM) family of products supports quick automation of many LTE and LTE-A RF measurements based on 3 GPP specifications using the UXM.

8 Visit for more information on 1. UXM and WTM Measurement Support for Transmitter Characteristics3 GPP TS Transmitter Characteristics3 GPP Maximum Output Power Reduction (MPR) Maximum Power Reduction (A-MPR) UE transmitted Output Output ON/OFF time time time Control Absolute power Control Relative power power control APUSCH-EVM with exclusion period Vector Magnitude (EVM)8 Yes Yes emissions for non allocated RB Equalizer spectrum Emission Spectrum Emission Channel Leakage power Spurious emissions8 Yes emission band UE co-existence8 Yes spurious emissions8 Yes intermodulation8 Yes 2No1 Measurement of EVM on the PUSCH and PUCCH is supported, but not on the Requires an external signal generator (such as N5172B X-Series RF vector signal generator).07 | Performing LTE and LTE-Advanced Measurements Application NoteTable 2. UXM and WTM Measurement Support for Receiver Characteristics3 GPP TS Receiver Characteristics3 GPP Sensitivity Sensitivity Level for CA (intraband contiguous DL CA and UL CA)10 Coming soon Sensitivity Level for CA (intraband contiguous DL CA without UL CA) Sensitivity Level for CA (interband DL CA without UL CA) Input Input Level for CA (intraband contiguous DL CA and UL CA)10 Coming soon Input Level for CA (intraband contiguous DL CA without UL CA) Input Level for CA (interband DL CA without UL CA) Channel Selectivity (ACS) Channel Selectivity (ACS) for CA (intraband contiguous DL CA and UL CA)10 Coming soon Channel Selectivity (ACS) for CA (intraband contiguous DL CA without UL CA)10 Yes Channel Selectivity (ACS) for CA (interband DL CA without UL CA)10 Yes blocking for CA (intraband contiguous DL CA and UL CA)

9 10 Coming soon blocking for CA (intraband contiguous DL CA without UL CA)10 Yes blocking for CA (interband DL CA without UL CA)10 Yes blocking8 Yes blocking for CA (intraband contiguous DL CA and UL CA)10 Coming soon blocking for CA (intraband contiguous DL CA without UL CA)10 Yes blocking for CA (interband DL CA without UL CA)10 Yes band blocking8 Yes band blocking for CA (intraband contiguous DL CA and UL CA)10 Coming soon band blocking for CA (intraband contiguous DL CA without UL CA)10 Yes band blocking for CA (interband DL CA without UL CA)10 Yes response8 Yes response for CA (intraband contiguous DL CA and UL CA)10 Coming soon response for CA (intraband contiguous DL CA without UL CA)10 Yes response for CA (interband DL CA without UL CA)10 Yes band Intermodulation8 Yes band Intermodulation for CA (intraband contiguous DL CA and UL CA)10 Coming soon band Intermodulation for CA (intraband contiguous DL CA without UL CA)10 Yes band Intermodulation for CA (interband DL CA without UL CA)10 Yes emissions8 Yes 5 No3 Requires an external signal generator (such as N5172B X-Series RF vector signal generator).

10 4 Ready for verification with a Requires an external signal analyzer (such as N9020A MXA signal analyzer).08 | Keysight | Performing LTE and LTE-Advanced Measurements Application Note3 Common Test clauses 6 and 7 describe RF measurements for transmitter and receiver char-acteristics, respectively. Some test parameters are defined for use with all of these Environmental ConditionsEach test requires measurement over a set of environmental conditions described by temperature and voltage. These conditions are defined in sub-clause In this application note, the test environment always consists of normal conditions (NC): +15 C to +35 C with relative humidity up to 75% (see Table ). Channel Bandwidths and Test For 3 GPP Rel-8 LTEEach UE supports a set of E-UTRA bands. Each E-UTRA band has a defined set of channel bandwidths (see Table ). Initial conditions are defined for each test including a set of channel bandwidths and a set of test frequencies.