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X-Ray Fluorescence Lab Report

X-Ray Physics of XRF XRF is a non destructive analytical technique that is used for elemental and chemical analysis. X-Ray Fluorescence Spectroscopy is the emission of characteristic secondary xmaterial that has been excited by bombarding with be used to investigate metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and studying the analyses of major tracewhen they interact with radiation. radiation like x-rays, they become iknock out an inner electron the atomelectron will fall into the place of the missing inner electron, as shown in figure 1. Energy is released due to the decrease in binding energy of the to the outer orbital.

X-Ray Fluorescence Spectroscopy is the emission of characteristic secondary x material that has been excited by bombarding with be used to investigate metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.

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Transcription of X-Ray Fluorescence Lab Report

1 X-Ray Physics of XRF XRF is a non destructive analytical technique that is used for elemental and chemical analysis. X-Ray Fluorescence Spectroscopy is the emission of characteristic secondary xmaterial that has been excited by bombarding with be used to investigate metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and studying the analyses of major tracewhen they interact with radiation. radiation like x-rays, they become iknock out an inner electron the atomelectron will fall into the place of the missing inner electron, as shown in figure 1. Energy is released due to the decrease in binding energy of the to the outer orbital.

2 The energy that is termed fluorescent radiation. The elements that are present in the sample. Ray Fluorescence Lab Report Nydia Esparza Victoria Rangel XRF is a non destructive analytical technique that is used for elemental and chemical analysis. Ray Fluorescence Spectroscopy is the emission of characteristic secondary x-rays from a material that has been excited by bombarding with high energy gamma rays or xmetals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology. In the case of the geological materials that we analyses of major trace elements is made possible by the behavior of atoms when they interact with radiation.

3 When a material is excited short wave length highrays, they become ionized. When the energy of the radiation is atom that is knocked out becomes unstable and an on will fall into the place of the missing inner electron, as shown in figure 1. (Figure 1) is released due to the decrease in binding energy of the inner electron orbital compared The energy that is being let off is released in the form or x-radiation. The fluorescent x-rays are used to detect the abundance of elements that are present in the sample. XRF is a non destructive analytical technique that is used for elemental and chemical analysis. rays from a high energy gamma rays or x-rays.

4 XRF can metals, glass, ceramics and building materials, and for research in In the case of the geological materials that we is made possible by the behavior of atoms When a material is excited short wave length high-energy onized. When the energy of the radiation is sufficient it will unstable and an outer on will fall into the place of the missing inner electron, as shown in figure 1. inner electron orbital compared -rays, this is ays are used to detect the abundance of Instrumentation (Figure 2) We used a portable X-Ray Fluorescence gun to perform this lab. The model we used was X-MET 3000 TXV+ , figure 2 is a similar representation of the device that was used for the lab.

5 XRF Project Results Project Team (Nydia Esparza and Victoria Rangel) Materials and Methodology There were three clay ceramic samples provided for analysis as can be observed in the figures below. The samples were labeled 17153Q, 17153S, and 17297D respectively. The samples were analyzed using the XMET3000 TXV+ which consisted of aluminum casing protected with lead tape to prevent radiation from escaping. The handheld device provided x-rays for the elemental analysis by running at 40 kV and 7mA. The device was ran at 300 seconds at a time to provide the spectrum for each sample. These spectrums were then analyzed using PyMca.

6 Data and Results The graphs below are in log scale for each sample and were modeled using a computer program. In each image, we can appreciate that two peaks failed to be modeled. The modeling provided the data in the tables seen below each image which include the elements present, the counts of each element, and the mass fraction of each element found. The following images are the data plots for the three samples. The data is represented by lines in three colors. The descriptive meaning for each line color is described below: :Spectrum-source data, : Fit-Fitted curve : Pileup-Background Sample 17153Q Data plot for sample 17153Q in log scaleTable A: Data for sample 17153 QElement Group Fit Area K K +03 Ca K +03 Ti K +03 Cr K +02 Mn K +03 Fe K +04 Ni K +02 Cu K +02 Zn K +03 Ga K +02 As K +02 Rb K +03 Sr K +04 Y K +03 Zr K +04 Nb K +03 Ag K +03 W L +02 Au L +03 in log scale Table A.

7 Data for sample 17153Q Sigma Area Mass fraction +01 +01 +01 +01 +01 +03 +01 +01 +01 +01 +01 +02 +02 +02 +02 +02 +02 +01 +02 Sample 17153S Data plot for sample 17153S in log scaleTable B: Data for sample 17153 SElement Group Fit Area K K +03 Ca K +03 Ti K +03 Cr K +02 Mn K +03 Fe K +04 Ni K +02 Cu K +02 Zn K +03 Ga K +02 As K +02 Rb K +03 Sr K +04 Y K +03 Zr K +04 Nb K +03 Ag K +03 W L +02 Au L +03 in log scale : Data for sample 17153S Sigma Area Mass fraction +01 +01 +01 +01 +01 +03 +01 +01 +01 +01 +01 +02 +02 +02 +02 +02 +02 +01 +02 Sample 17297 D Data plot for sample 17297D in log scaleTable C.

8 Data for sample 17297 DElement Group Fit Area SigmaK K +03 Ca K +03 Ti K +03 Cr K +02 Mn K +03 Fe K +05 Ni K +02 Cu K +02 Zn K +03 Ga K +02 As K +02 Rb K +03 Sr K +04 Y K +03 Zr K +04 Nb K +03 Ag K +04 W L +01 Au L +03 in log scale 297D Sigma Area Mass fraction +01 +01 +01 +01 +01 +02 +01 +01 +01 +01 +01 +02 +02 +02 +02 +02 +02 +01 +02 In each table, the data of importance for this lab was the fit area which gave the counts of each element. The fit area does not give the amount of the respective element present in the sample. The mass fraction is the amount of the element in each sample and this data is given for each element found in each sample.

9 Graphs: Plots of the highest counts were taken which are given by the fit area in the tables above and compared between the three samples. These plots can be appreciated in the figures below. The elements with the highest counts common to all three samples included: Fe, Ag, Au, As, Cr, and Cu. Two elements were compared at a time between all three samples for a total of fifteen plots. Sample 17153Q is represented by a red triangle, Sample 17153S by a green diamond, and Sample 17297D by a purple circle. + + + + + + + + + +00 +00 +00 +00 +00Ag CountFe CountFe vs Ag17153Q +0417153S +0517297D +05 + + + + + + + + +00 +00 +00 +00 +00Au CountFe CountFe vs Au17153Q +0417153S +0517297D + + + + + + + + + + + +00 +00 +00 +00 +00As CountFe CountFe vs As17153Q +0417153S +0517297D +05 + + + + + + + +00 +00 +00 +00 +00Cr CountFe CountFe vs Cr17153Q +0417153S +0517297D + + + + + + + + + +00 +00 +00 +00 +00Cu CountFe CountFe vs Cu17153Q +0417153S +0517297D +05 + + + + + + + +00 +00 +00 +00 +00Cr CountAu CountAu vs Cr17153Q +0317153S +0317297D + + + + + + + + + + + +00 +00 +00 +00 +00As CountAu CountAu

10 Vs As17153Q +0317153S +0317297D +03 + + + + + + + + +00 +00 +00 +00 +00Cu CountAu CountAu vs Cu17153Q +0317153S +0317297D + + + + + + + + + +00 +00 +00 +00 +00Au CountAg CountAg vs Au17153Q +0317153S +0417297D +04 + + + + + + + + + + +00 +00 +00 +00 +00As CountAg CountAg vs As17153Q +0317153S +0417297D + + + + + + + + +00 +00 +00 +00 +00Cr CountAg CountAg vs Cr17153Q +0317153S +0417297D +04 + + + + + + + + +00 +00 +00 +00 +00Cu CountAg CountAg vs Cu17153Q +0317153S +0417297D + + + + + + + + + + + + + + + +02Cu CountCr CountCr vs + + +02 + + + + + + + +00 +00 +00 +00 +00Cr CountAs CountAs vs Cr17153Q +0217153S +0217297D + + + + + + + + + +00 +00 +00 +00 +00Cu CountAs CountAs vs Cu17153Q +0217153S +0217297D +02 Mass Fraction Conclusion From the data obtained, we can conclude that although the samples looked very similar, they have slightly different counts in each element.


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