Chapter 6 VLSI Testing - NCU
Chapter 6VLSI Testing Jin-Fu LiAdvanced Reliable Systems (ARES) LaboratoryDepartment of Electrical EngineeringNational Central UniversityJungli, TaiwanAdvanced Reliable Systems (ARES) Li, EE, NCU2 Basics Fault Modeling Design-for-TestabilityOutlineAdvanced Reliable Systems (ARES) Li, EE, NCU3 Basics Fault Modeling Design-for-TestabilityOutlineAdvanced Reliable Systems (ARES) Li, EE, NCU4VLSI Realization ProcessDetermine requirementsWrite specificationsDesign synthesis and VerificationFabricationManufacturing testChips to customerCustomer s needTest developmentAdvanced Reliable Systems (ARES) Li, EE, NCU5VLSI Design CycleConceptBehavior SpecificationDesignerBehavior SynthesisRTL DesignLogic SynthesisNetlist (Logic Gates)Layout SynthesisLayout (Masks)ManufacturingFinal ProductDesignValidationRTLVerificationLa yout VerificationLogicVerificationProductVeri ficationAdvanced Reliable Systems (ARES) Li, EE, NCU6Role of Testing If you design a product, fabricate, and test it, and it fails the test, then there must be a cause for the failure Test was wrong The fabrication process was faulty The desi
Trends of Testing Two key factors are changing the way of VLSI ICs testing The manufacturing test cost has been not scaling The effort to generate tests has been growing geometrically along with product complexity 1 0.1 0.01 0.001 0.0001 0.00001 …
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