Power Semiconductor Reliability Handbook

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2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ........................................ ........................................ ........................................ .....................3 Qualification and Product Development ........................................ ........................................ .......................................3 Mass Customer Feedback and Failure Analysis.

test structures are chosen, either in the wafer-level form or the final package form, to do the reliability stress test to verify the robustness of the new technology. This initial reliability evaluation helps to further improve the design and process technology, if any weakness is found.

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