Power Semiconductor Reliability Handbook

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2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ........................................ ........................................ ........................................ .....................3 Qualification and Product Development ........................................ ........................................ .......................................3 Mass Customer Feedback and Failure Analysis ........................................ ........................................ .....................................4 Continuous Improvement.

example, when the breakdown voltage needs to be changed, the simulation involves all the structure changes to optimize the breakdown voltage, threshold voltage, channel resistance, various parasitic capacitances, and the trade-off with UIS robustness, etc. For a new package design, thermal resistance is very important.

  Breakdown