Power Semiconductor Reliability Handbook

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2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ........................................ ........................................ ........................................ .....................3 Qualification and Product Development ........................................ ........................................ .......................................3 Mass Customer Feedback and Failure Analysis ........................................ ........................................ .....................................4 Continuous Improvement.

There are certain wear-out mechanisms in a semiconductor device, such as electromigration, hot carrier degradation of a short-channel device, and gate-oxide wear-out. These failure mechanisms were harmful back in the 1980s, when semiconductor devices were very aggressively scaled down.

  Semiconductors