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Vi-Chip Environmental Qualification Testing …

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Page 1 of 14 VI chip Environmental Qualification Testing standards Revision:0 Report Dated: June 11th, 2014 Report Prepared By: Noel Joyce reliability Lab Manager Page 2 of 14 Table of Contents ........................................ ........................................ ........................................ ..................... 3 Summary ........................................ ........................................ ........................................ .. 3 Test Conditions. ........................................ ........................................ ....................... 4 HIGH TEMPERATURE OPERATING BIAS TEST (HTOB) ........................................ ................ 4 Test Criteria ........................................ ........................................ ........... 4 TEMPERATURE CYCLING (TC) TEST.

Page 1 of 14 VI Chip Environmental Qualification Testing Standards Revision:0 Report Dated: June 11th, 2014 Report Prepared By: Noel Joyce – Reliability

  Standards, Testing, Qualification, Reliability, Environmental, Chip, Chip environmental qualification testing, Chip environmental qualification testing standards

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