Transcription of Lorentz Dispersion Model - HORIBA
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Lorentz Dispersion Model - HORIBA
Lorentz Dispersion ModelSpectroscopic ellipsometry (SE) is a technique based on the measurement of the relative phasechange of reflected and polarized light in order to characterize thin film optical functions and otherproperties. The measured data are used to describe a Model where each layer refers to a given ma-terial. The Model uses mathematical relations called Dispersion formulae that help to evaluate thethickness and optical properties of the material by adjusting specific fit parameters. This application note deals with the Lorentzian Dispersion that the technical notes Classical Dispersion Model and Drude Dispersion Model are com-plementary to this modelThe Lorentz classical theory (1878) is based on theclassical theory of interaction between light and matterand is used to describe frequency dependent polariza-tion due to bound charge.
The parameters of the equations 4 parameters may be used in the expressions of the single Lorentz oscillator but it may be possible to char-acterize the function …
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