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Low- κ Dielectrics

1EE311/ Low-k Dielectrics1 tanford UniversityaraswatProf. Krishna SaraswatDepartment of Electrical EngineeringStanford UniversityStanford, CA DielectricsEE311/ Low-k Dielectrics2 tanford Universityaraswat Signaling Delay Power dissipation Bandwidth Self heating Data reliability (Noise) Cross talk ISI: impedance mismatch Area Depend on R, C and L ! Function and length dictates relative importance Performance Metrics Clocking Timing uncertainty (skew and jitter) Power dissipation Slew rate Area Power Distribution Supply reliability Reliability Electromigration2EE311/ Low-k Dielectrics3 tanford UniversityaraswatInterplay Between Signaling Metrics AR increase (tradeoffs)=> Better delay and electromigration Worse power and cross talk Increasing aspect ratio may not help Pay attention to different metrics simultaneously Design window quite complex Capacitance very important2 IMDILD totintIMDtalktotint2totinttotintAR11 CCXCfVCPRC!

•Proven CVD technology for 90 nm node. ... Spin-on Sol-Gel is the most common approach. Sol-Gel Process: Sol: (Organo) Silicate or Organic matrix forming a 3-D polymerization network in solvent. Gel: Organic solvent and “structure directing” molecules

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