Transcription of Power Semiconductor Reliability Handbook
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Power Semiconductor Reliability Handbook
2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ..3 qualification and Product Development ..3 Mass Customer Feedback and Failure Analysis ..4 Continuous Improvement ..4 2 Fundamentals of Reliability ..5 Definition of Bathtub Curve ..5 Infant-Mortality Random-Failure Region ..6 Wear-Out Region ..6 3 Reliability Test Methods ..7 Accelerated Life Temperature Acceleration ..8 Activation Voltage Acceleration.
Once the formal qualification is done on the frozen process and it passes all the stress tests, a larger quantity of the device is run to check the manufacturing process. Yield and some of the reliability monitoring data are reviewed closely to ensure
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