Transcription of Power Semiconductor Reliability Handbook
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Power Semiconductor Reliability Handbook
2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ..3 Qualification and Product Development ..3 Mass Customer Feedback and Failure Analysis ..4 Continuous Improvement ..4 2 Fundamentals of Reliability ..5 Definition of Bathtub Curve ..5 Infant-Mortality Random-Failure Region ..6 Wear-Out Region ..6 3 Reliability Test Methods ..7 Accelerated Life Temperature Acceleration ..8 Activation Voltage Acceleration ..9 Temperature-Cycle Humidity Acceleration ..10 4 Reliability Function for Data Analysis ..11 Definition of Reliability Function ..11 Failure Distribution Function ..11 Failure Probability Density Function.
a special case of the Weibull distribution with shape parameter m = 1 2.2.3 Wear-Out Region There are certain wear-out mechanisms in a semiconductor device, such as electromigration, hot carrier degradation of a short-channel device, and gate-oxide wear-out. These failure mechanisms were harmful back in the 1980s, when
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