Power Semiconductor Reliability Handbook

← Back to document page

2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ........................................ ........................................ ........................................ .....................3 Qualification and Product Development ........................................ ........................................ .......................................3 Mass Customer Feedback and Failure Analysis ........................................ ........................................ .....................................4 Continuous Improvement.

a special case of the Weibull distribution with shape parameter m = 1 2.2.3 Wear-Out Region There are certain wear-out mechanisms in a semiconductor device, such as electromigration, hot carrier degradation of a short-channel device, and gate-oxide wear-out. These failure mechanisms were harmful back in the 1980s, when

  Weibull