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Power Semiconductor Reliability Handbook

Power Semiconductor Reliability Handbook

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a special case of the Weibull distribution with shape parameter m = 1 2.2.3 Wear-Out Region There are certain wear-out mechanisms in a semiconductor device, such as electromigration, hot carrier degradation of a short-channel device, and gate-oxide wear-out. These failure mechanisms were harmful back in the 1980s, when

  Weibull

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