TEST METHOD STANDARD SEMICONDUCTOR DEVICES

MIL-STD-750D 28 FEBRUARY 1995 SUPERSEDING MIL-STD-750C 23 FEBRUARY 1983 DEPARTMENT OF DEFENSETEST METHOD STANDARDSEMICONDUCTOR DEVICESAMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is - POUNDNOTE: The cover page of this standardhas been changed for administrativereasons. There are no changes to Methds for SEMICONDUCTOR Military STANDARD is use by all Departments and Agencies of the Department of2. Beneficial comments (recommendations, additions, deletions) and any pertinent data which maybe of usein improving this document should be addressed to:Commander, Defense Electronics Supply Center, ATTN:DESC-ELD, 1507 Wilmington Pike, Dayton, OH 45444-5270 by using the Standardization Document ImprovementProposal (DD Form 1426) appearing at the end of this document or by Entire STANDARD .

pressure from 650 to 800 millimeters of mercury.Unless otherwise specified in the detail test method, for mechanical test methods, 2000 series, the ambient temperature may be +25°C ±lO°C. 4.1.1 Permissible temprature variation in environmental chambers.When chambers are used, specimens

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  Devices, Series, Tests, Standards, Methods, Pressure, Semiconductors, Test method standard semiconductor devices

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