TEST METHOD STANDARD SEMICONDUCTOR DEVICES

1 MIL-STD-750D 28 FEBRUARY 1995 SUPERSEDING MIL-STD-750C 23 FEBRUARY 1983 DEPARTMENT OF DEFENSETEST METHOD STANDARDSEMICONDUCTOR DEVICESAMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is - POUNDNOTE: The cover page of this standardhas been changed for administrativereasons. There are no changes to Methds for SEMICONDUCTOR Military STANDARD is use by all Departments and Agencies of the Department of2. Beneficial comments (recommendations, additions, deletions) and any pertinent data which maybe of usein improving this document should be addressed to:Commander, Defense Electronics Supply Center, ATTN.

2 DESC-ELD, 1507 Wilmington Pike, Dayton, OH 45444-5270 by using the Standardization Document ImprovementProposal (DD Form 1426) appearing at the end of this document or by Entire STANDARD - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -Purpose-------------------------------- ----Numbering system- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -Classification of tests - - - - - - - - - - - - - - - - - - - - - - - - - - - - Revisions------------------------------- ----- METHOD preference- - - - - - - - - - - - - - - - - - -- - - - - -APPLICABLE DOCUMENTS- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Government documents- - - - - - - - - - - - - - - - - -Specifications, standards .

3 And handbooks- - - - - - - - - - - - - - - - - - - -Other Government documents, drawings, and publications- - - - - - - - - - - - -Non-Government publications- - - - - - - - - - - - - - - - - - -Order of precedence- - - - - - - - - - - - - - - -- - -DEFINITIONS---------------------------- --------------Abbreviations,symbols, and definitions - - - - - - - - - - - - - - - - - - - -Abbreviations used in this STANDARD - - - - - - - - - - - - - - - - - - -GENERAL REQUIREMENTS- - - - - - - - - - - - - - - - - - - - -- - - -Test conditions- - - - - - - - - - - - - - - - - -Permissible temperature variation in environmental chambers - - - - - - - - - -Electrical test frequency- - - - - - - - - - - - - - - - - Accuracy-------------------------------- ---Test methods and circuits- - - - - - - - - - - - - - - - -Calibrationrequirements- - - - - - - - - - - - - - - -Orientations- - - - - - - - - - - - - - - - - - - - - - - - -- - - - - - - - -General precautions.

4 -Transients----------------------------- ------Test conditions for electrical measurements - - - - - - - - - - - - - - - - - -Pulse measurements- - - - - - - - - - - - - - - - - - - - - -- - - - - - - - -Test circuits- - - - - - - - - - - - - - - - - -Test METHOD variation - - - - - - - - - - - - - - - - - - - - - - - - - - - - -Soldering------------------------------ -----Order of connection of leads- - - - - - - - - - - - - - -Radiation precautions- - - - - - - - - - - - - - - - -Handling precautions- - - - - - - - - - - - - - - - - -UHF and microwave DEVICES - - - - - - - - - - - - - - -Electrostatic discharge sensitive (ESDS) DEVICES - - - - - - - - - - - - - - -Continuity verification of burn-in and life tests - - - - - - - - - - - - - - -Bias interruption- - - - - - - - - - - - - - - - - - - -Requirements for HTRB and burn-in - - - - - - - - - - - - - - - - - - - - - - -Bias requirements- - - - - - - - - - - - - - - - - - - - -- - - - - REQUIREMENTS- - - - - - - - - - - - - - - - - - - - - - - standardization agreement - - - - - - - - - - - - - - - - - - - -FIGURESF igure of noncylindrical SEMICONDUCTOR device to directionof accelerating force- - - - - - -- - - - - - - - - - - - - - - - - - - - - - of cylindrical SEMICONDUCTOR device to directionof accelerating force.

5 -INDEXI ndexNumerical index of test methods - - - - - - - - - - - - - - - - - - - - - - STANDARD establishes uniform methods for testing SEMICONDUCTOR DEVICES , includingbasic environmental tests to determine resistance to deleterious effects of natural elements and conditionssurrounding military operations, and physical and electrical the purpose of this STANDARD , theterm DEVICES includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes,and other related STANDARD is intended to apply only to SEMICONDUCTOR DEVICES . The testmethods described herein have been prepared to serve several specify suitable conditions obtainable in the laboratory that give test results equivalent tothe actual service conditions existing in the field, and to obtain reproducibility of the resultsof tests described herein are not to be interpreted as an exact and conclusiverepresentation of actual service operation in any one geographic location.

6 Since it is known thatthe only true test for operation in a specific location is an actual service test at that describe in one STANDARD all of the test methods of a similar character which now appear in thevarious joint-services SEMICONDUCTOR device specifications,so that these methods may be keptuniform and thus result in conservation of equipment,manhours, and testing facilities. Inachieving this objective, it is necessary to make each of the general tests adaptable to a broadrange of test methods described herein for environmental, physical, and electrical testing of devicesshall also apply, when applicable,to parts not covered by an approved military sheet-formstandard, specification sheet, or Numbering test methods are designated by numbers assigned in accordance with thefollowing Classification of tests are divided into five areas.

7 Test methods numbered 1001 to1999 inclusive, cover environmental tests ; those numbered 2001 to 2999 inclusive cover mechanical-characteristics tests are covered in two groups; 3001 to 3999 inclusivecovers tests for transistors and 4001 to 4999 covers tests for methods numbered 5000 to 5599inclusive are for high reliability space are numbered consecutively using a period to separate the test METHOD numberand the revision example, is the first revision of test METHOD METHOD of applicable, test methods contained herein shall be referenced in theindividual specification by specifying this STANDARD , the METHOD number,and the details required in thesummary of the applicable avoid the necessity for changing specifications that refer.

8 To thisstandard, the revision number should not be used when referencing test example,use 4001, APPLICABLE Government , standards , and handbook. The following specifications, standards , and handbooksform a part of this document to the extent specified otherwise specified, the issues ofthese documants are those listed in the issue of the Department of Defense Index of Specifications endStandards (DODISS) and supplement thereto, cited in the solicitation (see ).SPECIFICATIONSMILITARYMIL-S-19500- SEMICONDUCTOR DEVICES , General Specification Abbreviations for used on Drawings, Specification standards & in TechnicalDocunentsMIL-STD-202 - Test methods for Electronic and Electrical Component -Calibration Systems -Electrostatic Discharge Control Program for Protection of Electrical andElectronic Parts, Assemblies and Equipment (Excluding Electrically InitiatedExplosive DEVICES ) (Metric).

9 HANDBOOKS MILITARYMIL-HDBK-263- Electrostatic Discharge Control Handbook for Protection of Electrical andElectronic Parts, Assemblies and Equipment (Excluding Electrically InitiatedExplosive DEVICES ) (Metric).(Unless otherwise indicated, copies of federal and military specifications, standards , and handbooks areavailable from the Defense Printing Service Detachment Office, Bldg. 4D (Customer Service), 700 RobbinsAvenue, Philadelphia, PA 19111-5094.) Other Government documents. drawings. and publications. The following other Government documents,drawings, and publications form a part of this document to the extent specified herein. Unless otherwisespecified, the issues are those cited in the - JAN103-JAN107-JAN118-JAN124-JAN152-JAN17 4-JAN231-JAN233-JAN234-JAN236-JAN256-JAN 266-JANDRAWINGS - DESCD641 OOC64169C65017D65019C65042D65064C65101C6 6053B66054C66058- Filter for Testing Crystal Rectifier 1N23.

10 1N23A and Mixer for Testing Crystal Rectifier Type Figure of Merit Holder for Crystal Rectifier Mixer and Coupling Circuit for Crystal Rectifiers SA Band Crystal Detector Test Mixer for Electron Tube Type Burn Out Testing Equipment for 1N25 Crystals Schematic Loss Measuring Equipment for 1N25 Crystals Schematic Loss Measuring Equipment for 1N25 Crystals Bill of Burn Out Testing Equipment for 1N25 Crystals Bill of Reverse Pulse Recovery Time Test and Calibration Mixer Holder, Narrow, Band, for Diode Test Holder, 3,060 MHz (S-Band).- Sliding Load (S-Band) Used with Assembly, Tri-polar Diode Diode Test Holder, 9,37S GHz (X-Band).- Sliding Load (X-Band) Used with Diode Test Holder, 16 GHz (Ku-Band).- Sliding Load (Ku-Band) Used with Mixer Holder, Narrow Band, for Adaptor For Burn-Out Burn-Out Tester For Microwave (Copies of drawings may be obtained from the Defense Electronics Supply Center, Directorate of EngineeringStandardization (DESC-ELST), 1507 Wilmington Pike, Dayton, Ohio requesting copies of thesedrawings, both the identifying symbol number and title should be stipulated.)