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Process Average Testing (PAT) , Statistical Yield Analysis ...

Process Average Testing (PAT) , Statistical Yield Analysis ...

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The lot of parts being tested must be held in a manner that allows the outliers to be removed after the test limits for the lot have been calculated and applied. 4.) Application on electrical tests Any electrical parameter with a Cpk greater than 2.0 (CPK = 2.0 = 6σ) is considered a candidate for implementation.

  Testing, Process, Statistical, Average, Outliers, The outliers, Process average testing

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