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TOF-SIMSによる材料表面の有機物の分析
surface to a detector. TOF-SIMS features 1) the analysis of the chemical composition of the material's wide mass range (1-10,000 amu), and 4) high lateral resolution (0.1 µm), which allow its wide applications to the fields of tribology, adhesion, surface contamination analysis, organic surface treatment analysis, polymer and biochemical ...
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