Avago Technologies - IEEE 802
IEEE New Orleans January 2009Test patterns1Test patternsPiers DaweAvago TechnologiesIEEE New Orleans January 2009Test patterns2SupportersJonathan KingFinisarRyan LatchmanGennumIEEE New Orleans January 2009Test patterns3Introduction Table on next page describes the use of the various test patterns for 40GBASE-SR4 and 100GBASE-SR10 (SRn) Shows viable alternative patterns Shows which tests need the other lanes in the same direction or other direction operational, and which tests need a different pattern on the lane under test to the pattern on other lanes Shows which tests involve error counting Most of this would apply to the other optical PMDs. Some of it would apply to nAUIIEEE New Orleans January 2009Test patterns4Most tests use a mixed-frequency signal, a few use PRBS9 or square waveTest patterns in 10GbE, SFP+ and for 40/100GbEParameter12345AB @C %DEFRelated subclauseTypicalDemandingPRBS 31PRBS 9Scrambled idlesScrambled RFScrambled "test"Portion of n0GBASE-Rn signal10GBASE-R signalSquare 8
IEEE P802.3ba New Orleans January 2009 Test patterns 1 Test patterns Piers Dawe Avago Technologies
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