Transcription of Avago Technologies - IEEE 802
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Avago Technologies - IEEE 802
IEEE New Orleans January 2009 Test patterns1 Test patternsPiers DaweAvago TechnologiesIEEE New Orleans January 2009 Test patterns2 SupportersJonathan KingFinisarRyan LatchmanGennumIEEE New Orleans January 2009 Test patterns3 Introduction Table on next page describes the use of the various test patterns for 40 GBASE-SR4 and 100 GBASE-SR10 (SRn) Shows viable alternative patterns Shows which tests need the other lanes in the same direction or other direction operational, and which tests need a different pattern on the lane under test to the pattern on other lanes Shows which tests involve error counting Most of this would apply to the other optical PMDs. Some of it would apply to nAUIIEEE New Orleans January 2009 Test patterns4 Most tests use a mixed-frequency signal, a few use PRBS9 or square waveTest patterns in 10 GbE, SFP+ and for 40/100 GbEParameter12345AB @C %DEFR elated subclauseTypicalDemandingPRBS 31 PRBS 9 Scrambled idlesScrambled RFScrambled "test"Portion of n0 GBASE-Rn signal10 GBASE
IEEE P802.3ba New Orleans January 2009 Test patterns 1 Test patterns Piers Dawe Avago Technologies
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