Transcription of Power Semiconductor Reliability Handbook
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Power Semiconductor Reliability Handbook
2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ..3 Qualification and Product Development ..3 Mass Customer Feedback and Failure Analysis ..4 Continuous Improvement ..4 2 Fundamentals of Reliability ..5 Definition of Bathtub Curve ..5 Infant-Mortality Random-Failure Region ..6 Wear-Out Region ..6 3 Reliability Test Methods.
normal application stress. But care must be employed to ensure the stress level is reasonable. Over-stress should not occur. This concept is explained in Figure 2. Stress level (S) Over-stress failure mode not seen in actual application Normal stress model with known failure mechanism SO SS τ o τ S Lifetime τ O Figure 2. Once τ S) ) Rev. 1 ...
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