Power Semiconductor Reliability Handbook

← Back to document page

2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ........................................ ........................................ ........................................ .....................3 Qualification and Product Development.

normal application stress. But care must be employed to ensure the stress level is reasonable. Over-stress should not occur. This concept is explained in Figure 2. Stress level (S) Over-stress failure mode not seen in actual application Normal stress model with known failure mechanism SO SS τ o τ S Lifetime τ O Figure 2. Once τ S) ) Rev. 1 ...

  Stress, Mechanisms