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Power Semiconductor Reliability Handbook

Power Semiconductor Reliability Handbook

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normal application stress. But care must be employed to ensure the stress level is reasonable. Over-stress should not occur. This concept is explained in Figure 2. Stress level (S) Over-stress failure mode not seen in actual application Normal stress model with known failure mechanism SO SS τ o τ S Lifetime τ O Figure 2. Once τ S) ) Rev. 1 ...

  Stress, Mechanisms

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