Yield and Yield Management - Smithsonian Institution

3. Yield and Yield Management 3 Yield and Yield Management Clearly line Yield and defect density are two Yield improvement is the most critical goal of the most closely guarded secrets in the of all semiconductor operations as it reflects semiconductor industry. Line Yield refers to the amount of product that can be sold rela- the number of good wafers produced with- tive to the amount that is started. Yield is also out being scrapped, and in general, measures the single most important factor in overall the effectiveness of material handling, wafer processing costs. That is, incremental process control, and labor. Die Yield refers to increases in Yield (1 or 2 percent) signifi- the number of good dice that pass wafer cantly reduce manufacturing cost per wafer , probe testing from wafers that reach that or cost per square centimeter of silicon.

wafer processing costs. That is, incremental increases in yield (1 or 2 percent) signifi-cantly reduce manufacturing cost per wafer, or cost per square centimeter of silicon. In the fab, yield is closely tied to equipment perfor-mance (process capability), operator train-ing, overall organizational effectiveness, and fab design and construction.

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  Management, Yield, Wafer, Yield and yield management

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