Call for Papers - エレクトロニクス実装学会
Call for Papers 2018 International Conference on Electronics Packaging and IMAPS All Asia Conference Major Topics Advanced Packaging 2.5D/3D, Advanced CSP and POP, Advanced Flip-Chip, Automotive,
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A 36 W Wireless Power Transfer System with 82% …
www.jiep.or.jp32 Transactions of The Japan Institute of Electronics Packaging Vol. 6, No. 1, 2013 1. Introduction Recently, interest in wireless power transfer (WPT)
Packaging, Electronic, Institute, Japan, Japan institute of electronics packaging
Low Warpage Coreless Substrate for IC Packages
www.jiep.or.jp55 Kurashina et al.: Low Warpage Coreless Substrate (1/8) 1. Background With a continuous enhancement of performance and feature downsizing of electronic products, the use of Ball grid array (BGA) packages is spreading rapidly as elec-
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Comparison of Erosion Rates of SUS304 and SUS316 …
www.jiep.or.jp35 Comparison of Erosion Rates of SUS304 and SUS316 Stainless Steels by Molten Sn–3Ag–0.5Cu Solder Ikuo Shohji*, Kazuhito Sumiyoshi * and Makoto Miyazaki**
Steel, Stainless, Molten, Solder, Stainless steels by molten sn 3ag 0, 5cu solder
High Performance 3D Package for Wide IO Memory
www.jiep.or.jp45 Mohammed et al.: High Performance 3D Package for Wide IO Memory (3/8) Figure 8 shows that BVA offers the smallest pitch and highest IO compared to BGA (Ball Grid Array) PoP and Through Mold Via (TMV) PoP.
Micro Structure Observation and Reliability …
www.jiep.or.jp73 Orii et al.: Micro Structure Observation and Reliability Behavior (1/14) [Technical Paper] Micro Structure Observation and Reliability Behavior of Peripheral Flip Chip Interconnections with Solder-Capped Cu Pillar Bumps
Reliability, Micro, Structure, Observation, Behavior, Solder, Micro structure observation and reliability, Micro structure observation and reliability behavior
Inhibiting Cracking of Interfacial Cu6Sn5 by Ni …
www.jiep.or.jp46 Transactions of The Japan Institute of Electronics Packaging Vol. 2, No. 1, 2009 Inhibiting Cracking of Interfacial Cu6Sn5 by Ni Additions to Sn- …
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Mechanical Shock Durability Studies of Sn–Ag–Cu–Ni BGA ...
www.jiep.or.jp63 in Figure 3. The BGA pad surface finish consisted of ENIG, with Ni plating and Au plating from 1.6 to 2.0 μm and from 0.07 to 0.10 μm, respectively.
Mechanical, Studies, Shocks, Durability, Mechanical shock durability studies of sn ag cu ni
Reduction of the Oxide Layer on a Lead-Free Solder ...
www.jiep.or.jp1 Reduction of the Oxide Layer on a Lead-Free Solder Material by Hydrogen Radicals S. Kagata, T. Nakashima and A. Izumi Kyushu Institute of Technology, 1 …
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