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Crystal Structure Analysis

Crystal Structure Analysis

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(Covers most techniques used in traditional materials characterization) High Resolution X-ray Diffractometry and Topography, by D. Keith Bowen and Brian K. Tanner, Taylor & Francis, Ltd., 1998 (Semiconductors and thin film analysis) Modern Aspects of Small-Angle Scattering, by H. Brumberger, Editor, Kluwer Academic Publishers, 1993 (SAXS ...

  Structure, Characterization

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