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Scanning Electron Microscope

Scanning Electron Microscope

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electron source, optical aberrations of the final lens (objective) and the diffraction aberration on the final aperture. The spot size is smaller at shorter working distances. The incident electron beam is cone-shaped. The vertex angle of the cone is determined by the aperture angle. The wider the cone, the lower the depth of focus.

  Beam, Electron, Electron beam

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