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Figure 10-1 Testing AND and OR Gates for Stuck-at Faults

From Page 354-355 Instructions Defined in IEEE Standard BYPASS-- allows TDI serial data to go through a 1-bit bypass register on the IC instead of through the boundary scan register. SAMPLE/PRELOAD-- used to scan the boundary-scan register …

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Transcription of Figure 10-1 Testing AND and OR Gates for Stuck-at Faults

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