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电子能谱及其应用 - USTC
Volume 1: Auger and X-ray Photoelectron Spectroscopy”, John Wiley & Sons, 1996 4. Graham C. Smith, “Surface Analysis by Electron Spectroscopy: Measurement & Interpretation”, Plenum Press, New York, 1994 5. 吴正龙译《表面分析(XPS和AES) 引论》华东理工大学出版社，2008 6.
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X射线光电子能谱学》 - USTC
staff.ustc.edu.cnVolume 1: Auger and X-ray Photoelectron Spectroscopy”, John Wiley & Sons, 1992 4. Stefan Hüfner, “Photoelectron Spectroscopy: Principles and Applications”, Springer-Verlag, 2003, ISBN: 3-540-41802-4 5. Graham C. Smith, “Surface Analysis by Electron Spectroscopy: Measurement & Interpretation”, Plenum Press, New York, 1994 6.
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Computer Organization and Architecture 9th - USTC
staff.ustc.edu.cn17.6 Nonuniform Memory Access 640 17.7 Vector Computation 644 17.8 Recommended Reading 656 17.9 Key Terms, Review Questions, and Problems 657 Chapter 18 Multicore Computers 664 18.1 Hardware Performance Issues 665 18.2 Software Performance Issues 669 18.3 Multicore Organization 674 18.4 Intel x86 Multicore Organization 676 18.5 ARM11 MPCore 679
5.4 紧束缚模型 (tight-binding model) - USTC
staff.ustc.edu.cn- Linear combination of atomic orbitals (LCAO) 首先忽略电子之间相互作用，其次采用单电子近似 2 H i m V Ai V Bi] i i i 2 [2 则猜测波函数为两个原子的线性组合： i C i A (r i ) i B (r i) 若两个波函数相等，可以解出 1 C ( A B) 2 2() * * C H aa H ab dr
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staff.ustc.edu.cnof formation ∆ f Ho of a large number of atoms, free radicals, ions, clusters and compounds is available from the websites of NIST, NASA, CODATA, and IUPAC . Most authors prefer to use the BDE values at 298 .15 K . The following seven tables provide essential information of ex-perimental BDE values of R−X and R+−X bonds .
IEEE Standard for Verilog Hardware Description Language
staff.ustc.edu.cning on standardizing SystemVerilog in 2001, additional issues were identified that could possibly have led to incompatibilities between Verilog 1364 and SystemVerilog. The IEEE P1364 Working Group was estab-lished as a subcomittee of the SystemVerilog P1800 Working Group to help ensure consistent resolution of such issues.
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public.wsu.edu• X-ray Photoelectron Spectroscopy (XPS or ESCA) - using soft x-ray (200 - 1500 eV) radiation to examine core-levels. • Ultraviolet Photoelectron Spectroscopy (UPS) - using vacuum UV (10 - 45 eV) radiation to examine valence levels. • Auger Electron Spectroscopy(AES or SAM) – using energetic electron (1000 – 10,000 eV) to examine core ...
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