Transcription of a Performance Analog Multiplexers 3 V/5 V, 4/8 …
1 REV. AInformation furnished by Analog Devices is believed to be accurate andreliable. However, no responsibility is assumed by Analog Devices for itsuse, nor for any infringements of patents or other rights of third partieswhich may result from its use. No license is granted by implication orotherwise under any patent or patent rights of Analog V/5 V, 4/8 Channel HighPerformance Analog MultiplexersADG608/ADG609 Analog Devices, Inc., 1995 One Technology Way, Box 9106, Norwood, MA 02062-9106, : 617/329-4700 Fax: 617/326-8703 GENERAL DESCRIPTIONThe ADG608 and ADG609 are monolithic CMOS Analog mul-tiplexers comprising eight single channels and four differentialchannels respectively, fully specified for 5 V, +5 V and +3 Vpower supplies.
2 The ADG608 switches one of eight inputs to acommon output as determined by the 3-bit binary address linesA0, A1 and A2. The ADG609 switches one of four differentialinputs to a common differential output as determined by the2-bit binary address lines A0 and A1. An EN input on both de-vices is used to enable or disable the device. When disabled, allchannels are switched OFF. All the address and enable inputsare TTL compatible over the full specified operating tempera-ture range, making the parts suitable for bus-controlled systemssuch as data acquisition systems, process controls, avionics andATEs since the TTL compatible address inputs simplify the digitalinterface design and reduce the board space ADG608/ADG609 are designed on an enhanced LC2 MOSprocess that provides low power dissipation yet gives highswitching speed and low on resistance.
3 Each channel conductsequally well in both directions when ON and has an input signalrange which extends to the supplies. In the OFF condition, sig-nal levels up to the supplies are blocked. All channels exhibitbreak-before-make switching action preventing momentaryshorting when switching channels. Inherent in the design is lowcharge injection for minimum transients when switching thedigital ability to operate from single +3 V, +5 V or 5 V bipolarsupplies makes the ADG608 and ADG609 perfect for use inbattery operated instruments and with the new generation ofDACs and ADCs from Analog Devices. The use of 5 V sup-plies and reduced operating currents gives much lower powerdissipation than devices operating from 15 V HIGHLIGHTS1.
4 Extended Signal RangeThe ADG608/ADG609 are fabricated on an enhancedLC2 MOS process giving an increased signal range whichextends to the Low Power Dissipation3. Low RON4. Fast Switching Times5. Break-Before-Make SwitchingSwitches are guaranteed break-before-make so that inputsignals are protected against momentary Single/Dual Supply OperationORDERING GUIDEM odelTemperature RangePackage Option*ADG608BN 40 C to +85 CN-16 ADG608BR 40 C to +85 CR-16 AADG608 BRU 40 C to +85 CRU-16 ADG608 TRU 55 C to +125 CRU-16 ADG609BN 40 C to +85 CN-16 ADG609BR 40 C to +85 CR-16 AADG609 BRU 40 C to +85 CRU-16*N = Plastic DIP; RU = Thin Shrink Small Outline Package (TSSOP);R = " Small Outline IC (SOIC).
5 FUNCTIONAL BLOCK DIAGRAMSS1S8A0DA1 A2EN1 OF 8 DECODERADG608S1AA0 DAA1S4AS1BS4 BDBEN1 OF 4 DECODERADG609 FEATURES+3 V, +5 V, 65 V Power SuppliesVSS to VDD Analog Signal RangeLow On Resistance (30 V max)Fast Switching TimestON 75 ns maxtOFF 45 ns maxLow Power Dissipation ( mW max)Break-Before-Make ConstructionESD > 5000 V as per Military Standard and CMOS Compatible InputsAPPLICATIONSA utomatic Test EquipmentData Acquisition SystemsCommunication SystemsAvionics and Military SystemsMicroprocessor Controlled Analog SystemsMedical InstrumentationBattery Powered InstrumentsRemote Powered EquipmentCompatible with 65 V DACs and ADCs such asAD7840/8, AD7870/1/2/4/5/6/8 ADG608/ADG609 SPECIFICATIONSREV.
6 A 2 Parameter B Version T Version+258C 40 C to+258C 558C toTest Conditions/+858C+1258 CUnitsCommentsANALOG SWITCHA nalog Signal RangeVSS to VDDVSS to VDDVRON2222 typ V < VS < + V, IS = 1 mA;30353040 maxVDD = + V, VSS = V;Test Circuit 1 RON5656 max 3 V < VS < +3 V, IDS = 1 mA;VDD = +5 V, VSS = 5 VRON Match2323 maxVS = 0 V, IDS = 1 mA;VDD = +5 V, VSS = 5 VLEAKAGE CURRENTSVDD = + V, VSS = VSource OFF Leakage IS (OFF) typVD = V, VS = V; 2 10nA maxTest Circuit 2 Drain OFF Leakage ID (OFF) typVD = V, VS = V; ADG608 2 10nA maxTest Circuit 3 ADG609 1 5nA maxChannel ON Leakage ID, IS (ON) typVS = VD = V; ADG608 3 20nA maxTest Circuit 4 ADG609 10nA maxDIGITAL INPUTSI nput High Voltage, minInput Low Voltage, maxInput CurrentIINL or IINH 1 1 A maxVIN = 0 or VDDCIN, Digital Input Capacitance55pF typDYNAMIC CHARACTERISTICS2tTRANSITION5050ns typRL = 300 , CL = 35 pF;759075100ns maxVS1 = V, VS8 = V;Test Circuit 5tOPEN1010ns minRL = 300 , CL = 35 pF;VS = + V; Test Circuit 6tON (EN)5050ns typRL = 300 , CL = 35 pF;759075100ns maxVS = + V; Test Circuit 7tOFF (EN)3030ns typRL = 300 , CL = 35 pF;45604575ns maxVS = + V; Test Circuit 7 Charge Injection66pC typVS = 0 V, RS = 0 , CL = 1 nF;Test Circuit 8 OFF Isolation8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz.
7 VS = 3 V rms; Test Circuit 9 Channel-to-Channel Crosstalk8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz;Test Circuit 10CS (OFF)99pF typCD (OFF)ADG6084040pF typADG6092020pF typCD (ON)ADG6085454pF typADG6093434pF typPOWER A typVIN = 0 V or A A A maxNOTES1 Temperature ranges are as follows: B Version: 40 C to +85 C; T Version: 55 C to +125 by design, not subject to production subject to change without SUPPLY1(VDD = +5 V 6 10%, VSS = 5 V 6 10%, GND = 0 V, unless otherwise noted)Parameter B Version T Version+258C 408C to+258C 558C toTest Conditions/+858C+1258 CUnitsCommentsANALOG SWITCHA nalog Signal Range0 to VDD0 to VDDVRON4040 typVS = + V, IS = 1 mA;50605070 maxVDD = + V;Test Circuit 1 RON5656 max+1 V < VS < +3 V, IDS = 1 mA;VDD = +5 VRON Match2323 maxVS = 0 V, IDS = 1 mA;VDD = +5 VLEAKAGE CURRENTSVDD = + VSource OFF Leakage IS (OFF) typVD = V, VS = V; 2 10nA maxTest Circuit 2 Drain OFF Leakage ID (OFF) typVD = V, VS = V; ADG608 2 10nA maxTest Circuit 3 ADG609 1 5nA maxChannel ON Leakage ID, IS (ON) typVS = VD = V.
8 ADG608 3 20nA maxTest Circuit 4 ADG609 10nA maxDIGITAL INPUTSI nput High Voltage, minInput Low Voltage, maxInput CurrentIINL or IINH 1 1 A maxVIN = 0 or VDDCIN, Digital Input Capacitance55pF typDYNAMIC CHARACTERISTICS2tTRANSITION8080ns typRL = 300 , CL = 35 pF;100130100150ns maxVS1 = V/0 V, VS8 = 0 V;Test Circuit 5tOPEN1010ns minRL = 300 , CL = 35 pF;VS = + V; Test Circuit 6tON (EN)8080ns typRL = 300 , CL = 35 pF;100130100150ns maxVS = + V; Test Circuit 7tOFF (EN)4040ns typRL = 300 , CL = 35 pF;50605075ns maxVS = + V; Test Circuit 7 Charge typVS = 0 V, RS = 0 , CL = 1 nF;33pC maxTest Circuit 8 OFF Isolation8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz;VS = V rms; Test Circuit 9 Channel-to-Channel Crosstalk8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz;Test Circuit 10CS (OFF)99pF typCD (OFF)ADG6084040pF typADG6092020pF typCD (ON)ADG6085454pF typADG6093434pF typPOWER A typVIN = 0 V or A maxNOTES1 Temperature ranges are as follows: B Version: 40 C to +85 C; T Version: 55 C to +125 by design, not subject to production subject to change without SUPPLY1(VDD = +5 V 6 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)ADG608/ADG609 REV.
9 A 3 SINGLE SUPPLY1 REV. A 4 (VDD = + V 6 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)Parameter B Version T Version+258C 408C to+258C 558C toTest Conditions/+858C+1258 CUnitsCommentsANALOG SWITCHA nalog Signal Range0 to VDD0 to VDDVRON6060 typVS = + V, IS = 1 mA;9010090120 maxVDD = +3 V; Test Circuit 1 RON Match3333 maxVS = 0 V, IDS = 1 mA, VDD = + VLEAKAGE CURRENTSVDD = + VSource OFF Leakage IS (OFF) typVD = V, VS = V; 2 10nA maxTest Circuit 2 Drain OFF Leakage ID (OFF) typVD = V, VS = V;ADG608 2 10nA maxTest Circuit 3 ADG609 1 5nA maxChannel ON Leakage ID, IS (ON) typVS = VD = V;ADG608 3 20nA maxTest Circuit 4 ADG609 10nA maxDIGITAL INPUTSI nput High Voltage, minInput Low Voltage, maxInput CurrentIINL or IINH 1 1 A maxVIN = 0 or VDDCIN, Digital Input Capacitance55pF typDYNAMIC CHARACTERISTICS2tTRANSITION120120ns typRL = 300 , CL = 35 pF;170225170250ns maxVS1 = V/0 V, VS8 = 0 V;Test Circuit 5tOPEN1010ns minRL = 300 , CL = 35 pF;VS = + V; Test Circuit 6tON (EN)120120ns typRL = 300 , CL = 35 pF;170225170250ns maxVS = + V; Test Circuit 7tOFF (EN)4040ns typRL = 300 , CL = 35 pF;60756090ns maxVS = + V; Test Circuit 7 Charge typVS = 0 V, RS = 0 , CL = 1 nF.
10 33pC maxTest Circuit 8 OFF Isolation8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz;VS = 1 V rms; Test Circuit 9 Channel-to-Channel Crosstalk8585dB typRL = 1 k , CL = 15 pF, f = 100 kHz;Test Circuit 10CS (OFF)99pF typCD (OFF)ADG6084040pF typADG6092020pF typCD (ON)ADG6085454pF typADG6093434pF typPOWER A typVIN = 0 V or A maxNOTES1 Temperature ranges are as follows: B Version: 40 C to +85 C; T Version: 55 C to +125 by design, not subject to production subject to change without SPECIFICATIONSADG608/ADG609 REV. A 5 ABSOLUTE MAXIMUM RATINGS1(TA = +25 C unless otherwise noted)VDD to VSS .. +13 VVDD to GND .. V to + VVSS to GND .. + V to VAnalog, Digital Inputs2.