DAC8562 +5 Volt, Parallel Input Complete 12-Bit DAC

1 A +5 volt , Parallel Input Complete 12-Bit DAC. DAC8562 . FEATURES FUNCTIONAL BLOCK DIAGRAM. Complete 12-Bit DAC. No External Components REFOUT VDD. Single +5 volt Operation 1 mV/Bit with V Full Scale DAC-8562. True Voltage Output, 65 mA Drive 12-Bit . REF VOUT. Very Low Power 3 mW DAC. 12. APPLICATIONS. AGND. Digitally Controlled Calibration DAC REGISTER. Servo Controls 12. Process Control Equipment PC Peripherals DGND CE DATA CLR. GENERAL DESCRIPTION The DAC8562 is available in two different 20-pin packages, The DAC8562 is a Complete , Parallel Input , 12-Bit , voltage out- plastic DIP and SOL-20. Each part is fully specified for opera- put DAC designed to operate from a single +5 volt supply. Built tion over 40 C to +85 C, and the full +5 V 5% power supply using a CBCMOS process, these monolithic DACs offer the range. user low cost, and ease-of-use in +5 volt only systems. For MIL-STD-883 applications, contact your local ADI sales Included on the chip, in addition to the DAC, is a rail-to-rail office for the DAC8562 /883 data sheet which specifies opera- amplifier, latch and reference.

2 The reference (REFOUT) is tion over the 55 C to +125 C temperature range. trimmed to volts, and the on-chip amplifier gains up the DAC output to volts full scale. The user needs only sup- 1. ply a +5 volt supply. VDD = +5V. TA = 55 C, +25 C, +125 C. The DAC8562 is coded straight binary. The op amp output LINEARITY ERROR LSB. swings from 0 to + volts for a one millivolt per bit resolu- tion, and is capable of driving 5 mA. Built using low tempera- 55 C. ture-coefficient silicon-chrome thin-film resistors, excellent linearity error over temperature has been achieved as shown be- 0. low in the linearity error versus digital Input code plot. Digital interface is Parallel and high speed to interface to the fastest processors without wait states. The interface is very sim- ple requiring only a single CE signal. An asynchronous CLR in- +25 C & +125 C. put sets the output to zero scale. 1. 0 1024 2048 3072 4096. DIGITAL Input CODE Decimal Figure 1.

3 Linearity Error vs. Digital Input Code Plot REV. A. Information furnished by analog devices is believed to be accurate and reliable. However, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or One Technology Way, Box 9106, Norwood, MA 02062-9106, otherwise under any patent or patent rights of analog devices . Tel: 617/329-4700 Fax: 617/326-8703. DAC8562 SPECIFICATIONS. ELECTRICAL CHARACTERISTICS (@ VDD = + 6 5%, RS = No Load, 408C TA +858C, unless otherwise noted). Parameter Symbol Condition Min Typ Max Units STATIC PERFORMANCE. Resolution N Note 2 12 Bits Relative Accuracy INL E Grade 1/2 1/4 +1/2 LSB. F Grade 1 3/4 +1 LSB. Differential Nonlinearity DNL No Missing Codes 1 3/4 +1 LSB. Zero-Scale Error VZSE Data = 000H +1/2 +3 LSB. Full-Scale Voltage VFS Data - FFFH3.

4 E Grade V. F Grade V. Full-Scale Tempco TCVFS Notes 3, 4 16 ppm/ C. analog OUTPUT. Output Current IOUT Data = 800H 5 7 mA. Load Regulation at Half Scale LDREG RL = 402 to , Data = 800H 1 3 LSB. Capacitive Load CL No Oscillation4 500 pF. REFERENCE OUTPUT. Output Voltage VREF V. Output Source Current IREF Note 5 5 7 mA. Line Rejection LNREJ %/V. Load Regulation LDREG IREF = 0 to 5 mA %/mA. LOGIC INPUTS. Logic Input Low Voltage VIL V. Logic Input High Voltage VIH V. Input Leakage Current IIL 10 A. Input Capacitance CIL Note 4 10 pF. INTERFACE TIMING SPECIFICATIONS1, 4. Chip Enable Pulse Width tCEW 30 ns Data Setup tDS 30 ns Data Hold tDH 10 ns Clear Pulse Width tCLRW 20 ns AC CHARACTERISTICS4. Voltage Output Settling Time6 tS To 1 LSB of Final Value 16 s Digital Feedthrough 35 nV sec SUPPLY CHARACTERISTICS. Positive Supply Current IDD VIH = V, VIL = V 3 6 mA. VIL = 0 V, VDD = +5 V 1 mA. Power Dissipation PDISS VIH = V, VIL = V 15 30 mW.

5 VIL = 0 V, VDD = +5V 3 5 mW. Power Supply Sensitivity PSS VDD = 5% %/%. NOTES. 1. All Input control signals are specified with t r = tf = 5 ns (10% to 90% of +5 V) and timed from a voltage level of V. 2. 1 LSB = 1 mV for 0 to + V output range. 3. Includes internal voltage reference error. 4. These parameters are guaranteed by design and not subject to production testing. 5. Very little sink current is available at the REFOUT pin. Use external buffer if setting up a virtual ground. 6. The settling time specification does not apply for negative going transitions within the last 6 LSBs of ground. Some devices exhibit double the typical settling time in this 6 LSB region. Specifications subject to change without notice. 2 REV. A. DAC8562 . (@ VDD = + V 6 5%, RL = No Load, TA = +258C, applies to part number DAC8562 GBC only, WAFER TEST LIMITS unless otherwise noted). Parameter Symbol Condition Min Typ Max Units STATIC PERFORMANCE.

6 Relative Accuracy INL 1 3/4 +1 LSB. Differential Nonlinearity DNL No Missing Codes 1 3/4 +1 LSB. Zero-Scale Error VZSE Data = 000H +1/2 +3 LSB. Full-Scale Voltage VFS Data = FFFH V. Reference Output Voltage VREF V. LOGIC INPUTS. Logic Input Low Voltage VIL V. Logic Input High Voltage VIH V. Input Leakage Current IIL 10 A. SUPPLY CHARACTERISTICS. Positive Supply Current IDD VIH = V, VIL = V 3 6 mA. VIL = 0 V, VDD = +5 V 1 mA. Power Dissipation PDISS VIH = V, VIL = V 15 30 mW. VIL = 0 V, VDD = +5 V 3 5 mW. Power Supply Sensitivity PSS VDD = 5% %/%. NOTE. 1. Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing. ABSOLUTE MAXIMUM RATINGS* 1 tCEW. VDD to DGND and AGND.

7 V, +10 V CE. 0. Logic Inputs to DGND .. V, VDD + V tDS tDH. VOUT to AGND .. V, VDD + V 1. VREFOUT to AGND .. V, VDD + V DB11 0 DATA VALID. 0. AGND to DGND .. V, VDD. 1 tCLRW. IOUT Short Circuit to GND .. 50 mA. CLR. Package Power Dissipation .. (TJ max TA)/uJA 0. Thermal Resistance uJA FS. 1 LSB. 20-Pin Plastic DIP Package (P) .. 74 C/W VOUT. ERROR BAND. 20-Lead SOIC Package (S) .. 89 C/W ZS. tS tS. Maximum Junction Temperature (TJ max) .. 150 C. Operating Temperature Range .. 40 C to +85 C Figure 2. Timing Diagram Storage Temperature Range .. 65 C to +150 C. Table I. Control Logic Truth Table Lead Temperature (Soldering, 10 secs) .. +300 C. *Stresses above those listed under Absolute Maximum Ratings may cause CE CLR DAC Register Function permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the H H Latched operational sections of this specification is not implied.

8 Exposure to absolute L H Transparent maximum rating conditions for extended periods may affect device reliability. + H Latched with New Data X L Loaded with All Zeros H + Latched All Zeros + Positive Logic Transition; X Don't Care. CAUTION. ESD (electrostatic discharge) sensitive device. The digital control inputs are diode protected;. however, permanent damage may occur on unconnected devices subject to high energy electrostatic WARNING! fields. Unused devices must be stored in conductive foam or shunts. The protective foam should be discharged to the destination socket before devices are inserted. ESD SENSITIVE DEVICE. REV. A 3 . DAC8562 . Table II. Nominal Output Voltage vs. Input Code PIN CONFIGURATIONS. Binary Hex Decimal Output (V). 20-Pin P-DIP SOL-20. (N-20) (R-20) 0000 0000 0000 000 0 Zero Scale 0000 0000 0001 001 1 DB3 1 20 VDD 1 0000 0000 0010 002 2 0000 0000 1111 00F 15 DB4 2 19 DB2. 0000 0001 0000 010 16 DB5 3 18 DB1 DAC-8562 0000 1111 1111 0FF 255 TOP VIEW 0001 0000 0000 100 256 DB6 4 17 DB0.

9 (Not to Scale). 5 DAC-8562 0001 1111 1111 1FF 511 DB7 16 CE. TOP VIEW 0010 0000 0000 200 512 DB8 6 15 CLR. (Not to Scale) 0011 1111 1111 3FF 1023 DB9 7 14 REFOUT 0100 0000 0000 400 1024 DB10 8 13 VOUT. 0111 1111 1111 7FF 2047 1000 0000 0000 800 2048 Half Scale DB11 9 12 AGND. 1100 0000 0000 C00 3072 DGND 10 11 NC 1111 1111 1111 FFF 4095 Full Scale NC = NO CONNECT. PIN DESCRIPTIONS. ORDERING GUIDE. Pin Name Description INL Temperature Package Model (LSB) Range Option 20 VDD Positive supply. Nominal value +5 volts, 5%. DAC8562EP 1/2 40 C to +85 C N-20 1-9 DB0-DB11 Twelve Binary Data Bit inputs. DB11. DAC8562FP 1 40 C to +85 C N-20 17-19 is the MSB and DB0 is the LSB. DAC8562FS 1 40 C to +85 C R-20. DAC8562 GBC 1 +25 C Dice 16 CE Chip Enable. Active low Input . 15 CLR Active low digital Input that clears the DAC register to zero, setting the DAC. DICE CHARACTERISTICS to minimum scale. 8 DGND Digital ground for Input logic.

10 AGND DGND DB11. 12 AGND analog Ground. Ground reference for 12 10 9 the internal bandgap reference voltage, 8 DB10 the DAC, and the output buffer. VOUT 13. 13 VOUT Voltage output from the DAC. Fixed REFOUT 14 output voltage range of 0 V to V. 7 DB9. with 1 mV/LSB. An internal tempera- ture stabilized reference maintains a CLR 15 6 DB8 fixed full-scale voltage independent of time, temperature and power supply variations. 5 DB7. CE 16 14 REFOUT Nominal V reference output volt - age. This node must be buffered if re- DB0 17 4 DB6 quired to drive external loads. 11 NC No Connection. Leave pin floating. DB1 18 3 DB5. 19 20 1 2. DB2 VDD DB3 DB4. SUBSTRATE IS COMMON WITH VDD. TRANSISTOR COUNT: 524. DIE SIZE: X INCH; 7350 SQ MILS. 4 REV. A. DAC8562 . OPERATION current is provided by a P channel pull-up device that can sup- The DAC8562 is a Complete ready to use 12-Bit digital-to- ply GND terminated loads, especially important at the 5%.